World-Class Resources > Metrology Labs > Analytical & Characterization Techniques > FEI-200 Single Beam FIB
FEI-200 Single Beam FIB
- Gallium ion source
- Pt metal deposition
- 10 nm Ga beam imaging resolution
Typical Applications: cross-sectional imaging; TEM sample preparation; Pt Metal deposition; defect analysis; electrical contacts to nanoscale materials