World-Class Resources > CNSE Wafer Processing Research & Development > Analytical Services
Analytical Services
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"Our expert staff is ready to
assist you in solving a wide
variety of metrology problems.
The modern CNSE tool set
can provide timely data on
failures, raw material purity,
structural analysis and
contamination.Our experts
can provide you with the
information you need to
solve your problems quickly."
Dr. Steven Novak,
CNSE Assistant Vice
President, Metrology |
The following Material Analysis services are available at the CNSE fabrication facilities:
AES
FIB
SEM
SIMS
TEM
XPS
AFM
To submit a Analytical Services Request, click here.