CNSE co-sponsored and hosted the 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, which was presented by the National Institute of Standards and Technology (NIST) and is the world's premier conference focusing on new frontiers and leading-edge innovations in characterization and metrology of nanoelectronics. The conference brought scientists and engineers from around the world to CNSE's Albany NanoTech Complex to discuss all aspects of the characterization and metrology needed for research, development and manufacturing of nanoelectrics materials and devices. (5/11-14/09)